The Magazine :: Process Online
What happened
Process Online's magazine content highlights rising OT cyber risk and the continuing importance of practical field skills alongside digital tools. The editorial collection stresses that every OT update increases cyber exposure and that local troubleshooting ability remains a primary recovery path; use these pieces to prioritise firmware SLAs and on-site skill validation
Buyer takeaway
Use editorial guidance to justify firm contractual requirements for firmware SLAs, local spare holdings and supplier training commitments
Cost / money
Directional increase in support and lifecycle costs as buyers accept more firmware-dependent solutions unless costs are addressed contractually
Supplier / commercial
Vendors will push software/service bundles; buyers should insist on named SLAs and pass-through limits to control recurring costs
Safety / operations
Highlights that over-reliance on remote diagnostics without local competence can lengthen incident resolution and increase safety exposure
What to watch
Content is thematic rather than a single event; use it to support RFP language but treat specific supplier claims as unverified until documented
Key facts
- Feature articles on OT cyber risk and practical skills
- Guides on remote connectivity, predictive maintenance and firmware considerations
Source excerpts
0: Ignore at your peril Monitoring motor supply pays off Training: are the fundamentals being left behind?
Could Australia’s newest city lead the world in sustainability?
AI won’t restart your plant: Why practical skills matter more than ever PDF Seeing with AI Open Process Automation: How and where to start Virtual PLCs – a big step forward Five common mistakes in industrial temperature monitoring Cyber risk is rising faster than Australian manufacturers can respond PDF December 2025/January 2026 The environmental impact of AI: a help or hindrance for industry? Interview with Jimmy Martin, Chief Executive Officer, AMCS Group Towards greener and economical desalination solution
